JEOL JSM-7200F Field Emission SEM
About
Nominal resolution is about 1 nm. This high resolution SEM is ideal for both imaging and analysis of nanostructures, and determining chemical composition of the sample through X-ray spectroscopy. By combining large beam currents with a small probe size at any accelerating voltage, the JEOL JSM-7200F provides analytical resolution to the sub 100 nm scale.
Located CF 022
Primary Contact
Mike Kraft
he/him
Michael.Kraft@wwu.edu
(360) 650-3879
ES 508a
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JEOL JSM-7200F Field Emission SEM
Detectors:
Everhart-Thornley secondary electron detector (SE)
Retractable backscatter detector (BSE)
Deben HAADF Annular SEM STEM detector
150 mm² Oxford X-Max EDS detector
Modes:
through-the-lens (TTL)
gentle beam (GB)
low-vacuum (LV)
Sample Preparation
- Carbon coater. The carbon coater pulses a strong current through graphite rods to coat samples in fine mist of conductive carbon.
- RMC Boeckeler PowerTome PC cryogenic ultramicrotome. The microtome creates nanometer thin sections, ideal for sample analysis with our STEM detector.
- CO2 critical point dryer. The CPD allows for gentle dehydration of a sample, preventing tissue damage from rapid atmospheric evaporation.
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