Scanning Electron Microscopy and Energy Dispersive Spectroscopy
Scanning electron microscopy (SEM) is a type of electron microscopy that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.
Energy-dispersive X-ray Spectroscopy (EDS) is an analytical technique used for the elemental analysis of a sample that relies on the characteristic x-rays emitted when the beam of electrons in focused on the sample.
SEM and EDS are ideal for both imaging and analysis of nanostructures and determining chemical composition of the sample.